Fast Read Access Time--150 ns CMOS Technology for Low Power Dissipation 30 mA Active 100 �A Standby Fast Byte Write or 1 ms Data Retention >200 years Endurance - Minimum 104 Erase/Write Cycles - Automatic Write Operation - Internal Control Timer - Auto-Clear Before Write Operation - On-Chip Address and Data Latches Data Polling Chip Clear Operation Enhanced Data Protection - VCC Detector - Pulse Filter - Write Inhibit 5-Volt-Only Operation Organized 512x8 JEDEC standard pinout - 24-pin Dual-In-Line Package - 32-pin PLCC Package Available for Extended Temperature Ranges: - Commercial: +70�C - Industrial: to +85�CDESCRIPTION
The Microchip Technology Inc. is a CMOS 4K non-volatile electrically Erasable and Programmable Read Only Memory (EEPROM). The 28C04A is accessed like a static RAM for the read or write cycles without the need of external components. During a "byte write", the address and data are latched internally, freeing the microprocessor address and data bus for other operations. Following the initiation of write cycle, the device will to a busy state and automatically clear and write the latched data using an internal control timer. To determine when a write cycle is complete, the 28C04A uses Data polling. Data polling allows the user to read the location last written to when the write operation is complete. CMOS design and processing enables this part to be used in systems where reduced power consumption and reliability are required. A complete family of packages is offered to provide the utmost flexibility in applications.Data Protection Circuitry Chip Enable/ Output Enable Control Logic
Function Address Inputs Chip Enable Output Enable Write Enable Data Inputs/Outputs +5V Power Supply Ground No Connect; No Internal Connection Not Used; No External Connection is Allowed
VCC and input voltages w.r.t. VSS....... + 6.25V Voltage on OE w.r.t. VSS...................... to +13.5V Output Voltage w.r.t. to VCC+0.6V Storage temperature.......................... to +125�C Ambient temp. with power applied....... to +95�C
*Notice: Stresses above those listed under "Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.VCC +5V �10% Commercial (C): Tamb = Industrial (I): Tamb to +85�C Conditions
Parameter Input Voltages Input Leakage Input Capacitance Output Voltages Output Leakage Output Capacitance Power Supply Current, Active Power Supply Current, StandbyTTL input ICC(S)TTL TTL input ICC(S)TTL CMOS input ICC(S)CMOS
Note 1: AC power supply current above 5 MHz; 1 mA/MHz.
AC Testing Waveform: Output Load: Input Rise and Fall Times: Ambient Temperature: 28C04A-15 Parameter Address to Output Delay CE to Output Delay OE to Output Delay to OE High Output Float Output Hold from Address, CE or OE, whichever occurs first Endurance Sym Min tACC tCE tOE tOFF tOH 0 1M Max 1M Min Max 1M Min Max ns cycles 25�C, Vcc = 5.0V, Block Mode (Note) CE = VIL OE = VIL CE = VIL VIH = 2.4V; VIL = 0.45V; VOH = 2.0V; VOL 0.8V 1 TTL Load 20 ns Commercial (C): Tamb to +70�C Industrial (I): Tamb 28C04A-20 28C04A-25 Units Conditions
Note: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific application, please consult the Total Endurance Model which can be obtained on our BBS or website.
VIH OE VIL VOH Data VOL WE VIH VIL Notes: (1) tOFF is specified for OE or CE, whichever occurs first (2) OE may be delayed t OE after the falling edge of CE without impact on tCE (3) This parameter is sampled and is not 100% tested t ACC t OE(2) High t OH Valid Output High Z