100344DMQB Datasheet



Features, Applications

The 100344 contains eight D-type latches, individual inputs (Dn), outputs (Qn), a common enable pin (E), latch enable (LE), and output enable pin (OEN). A Q output follows its D input when both E and LE are LOW. When either or LE (or both) are HIGH, a latch stores the last valid data present on its D input prior or LE going HIGH. A HIGH on OEN holds the outputs in a cut-off state. The cut-off state is designed to be more negative than a normal ECL LOW level. This allows the output emitter-followers to turn off when the termination supply is -2.0V, presenting a high impedance to the data bus. This high impedance reduces termination power and prevents loss of low state noise margin when several loads share the bus. The 100344 outputs are designed to drive a doubly terminated 50 transmission line (25 load impedance). All inputs have 50 k pull-down resistors.


Cut-off drivers Drives 25 load Low power operation 2000V ESD protection Voltage compensated operating range to -5.7V Available to MIL-STD-883

Description Data Inputs Enable Input Latch Enable Input Output Enable Input Data Outputs
Inputs Dn LE OEN Outputs L H Latched (Note 1) Latched (Note 1) Cutoff

H = HIGH Voltage level L = LOW Voltage level Cutoff = lower-than-LOW state X = Don't Care Note 1: Retains data present before either E go HIGH.

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Above which the useful life may be impaired Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic VEE Pin Potential to Ground Pin Input Voltage (DC) Output Current (DC Output HIGH) to +0.5V VEE -100 mA

Case Temperature (TC) Military Supply Voltage (VEE) to -4.2V

Note 2: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 3: ESD testing conforms to MIL-STD-883, Method 3015.

VEE to -5.7V, VCC = VCCA = GND, to +125�C Symbol VOH Parameter Output HIGH Voltage Min -1025 -1085 VOL Output LOW Voltage -1830 VOHC Output HIGH Voltage -1035 -1085 VOLC Output LOW Voltage -1610 -1555 VOLZ Cutoff LOW Voltage mV -1850 VIH VIL IIL IIH Input HIGH Voltage Input LOW Voltage Input LOW Current Input HIGH Current IEE Power Supply Current mV �A Max Units to +125�C Inputs Open VEE to -4.8V VEE to -5.7V Guaranteed HIGH Signal for All Inputs Guaranteed LOW Signal for All Inputs VEE = -4.2V VIN = VIL (Min) VEE = -5.7V VIN = VIH (Max) VIN = VIH (Min) or VIL (Max) OEN = HIGH (Notes 5, 6) (Notes 5, 6) (Notes 5, 6) VIN = VIH (Min) or VIL (Max) Loading with to -2.0V (Notes 5, 6) VIN = VIH (Max) or VIL (Min) Loading with to -2.0V (Notes 5, 6) Conditions Notes

Note F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55�C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 5: Screen tested 100% on each device -55�C, +25�C, and +125�C, Subgroups and 8. Note 6: Sample tested (Method 5005, Table I) on each manufactured lot -55�C, +25�C, and +125�C, Subgroups 3, 7, and 8. Note 7: Guaranteed by applying specified input condition and testing VOH/VOL.



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