49FCT805T Datasheet

Dual 1:5 Clock Driver W/ttl Outputs


Features, Applications

0.5 MICRON CMOS Technology Guaranteed low skew < 500ps (max.) Very low duty cycle distortion < 600ps (max.) Low CMOS power levels TTL compatible inputs and outputs TTL level output voltage swings High drive: -32mA IOH, +48mA IOL Two independent output banks with 3-state control 1:5 fanout per bank "Heartbeat" monitor output ESD > 2000V per MIL-STD-883, Method > 200V using machine model = 0) Available in the following packages: � Commercial: QSOP, SOIC, SSOP � Military: CERDIP, LCC

This buffer/clock driver is built using advanced dual metal CMOS technology. The is a non-inverting clock driver consisting of two banks of drivers. Each bank drives five output buffers from a standard TTL compatible input. This part has extremely low output skew, pulse skew, and package skew. The device has a "heart-beat" monitor for diagnostics and PLL driving. The monitor output is identical to all other outputs and complies with the output specifications in this document. The FCT805T is designed for fast, clean edge rates to provide accurate clock distribution in high speed systems.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

NOTE: 1. Pin 8 is internally connected to GND. To insure compatibility with all products, pin 8 should be connected to GND at the board level.

Symbol VTERM TSTG IOUT Description Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max to +120 Unit �C mA

Pin Names OEA, OEB INA, INB OAx, OBx MON Clock Inputs Clock Outputs Monitor Output Description 3-State Output Enable Inputs (Active LOW)

NOTE: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 4.5 5.5 Max. 6 8 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.

Following Conditions Apply Unless Otherwise Specified: Commercial: to +70�C, Military: to +125�C, VCC � 10%

Symbol VIH VIL IIH IIL IOZH IOZL II VIK IOS VOH Parameter Input HIGH Level Input LOW Level Input HIGH Current(5) Input LOW Current(5) High Impedance Output Current (3-State Output Pins) Input HIGH Current Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Min., IIN = �18mA VCC = Max., VO = VCC = Min. VIN = VIH or VIL GND(3) IOH = �12mA MIL IOH = �15mA COM'L IOH = �24mA MIL IOH �32mA COM'L(4) VOL IOFF VH ICCL ICCH ICCZ

NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at Vcc 5V, +25�C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. Duration of the condition should not exceed one second. 5. The test limit for this parameter = -55�C.

Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max. = 0.5V VCC = Max., VI = VCC (Max.)

Output LOW Voltage Input/Output Power Off Leakage(5) Input Hysteresis for all inputs Quiescent Power Supply Current



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