Homedatasheet54ACT11030

54ACT11030 Datasheet

8-input Positive-nand Gates
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Description

Features, Applications

Inputs Are TTL-Voltage Compatible Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise EPIC TM (Enhanced-Performance Implanted CMOS) 1-�m Process 500-mA Typical Latch-Up Immunity at 125�C Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs

description

These devices contain a single 8-input NAND gate and perform the following Boolean functions in positive logic: H or Y=A+B+C+D+E+F+G+H The 54ACT11030 is characterized for operation over the full military temperature range to 125�C. The 74ACT11030 is characterized for operation from to 85�C.

FUNCTION TABLE INPUTS A THRU H All inputs H One or more inputs L OUTPUT L H

This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, J, and N packages.

PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)

Supply voltage range, VCC. 6 V Input voltage range, VI (see Note V to VCC 0.5 V Output voltage range, VO (see Note V to VCC 0.5 V Input clamp current, IIK (VI VI > VCC). 20 mA Output clamp current, IOK (VO VO > VCC). 50 mA Continuous output current, IO (VO 0 to VCC). 50 mA Continuous current through VCC or GND. 100 mA Storage temperature range. to 150�C

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

54ACT11030 MIN VCC VIH VIL VI VO IOH IOL /v TA Supply voltage High-level input voltage Low-level input voltage Input voltage Output voltage High-level output current Low-level output current Input transition rise or fall rate Operating free-air temperature VCC MAX 5.5 74ACT11030 MIN 2 0.8 VCC MAX 5.5 UNIT mA ns/ V �C

electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)

VI = VCC or GND 5V 3.5 Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms. This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than V or VCC.

switching characteristics over recommended operating free-air temperature range, VCC 0.5 V (unless otherwise noted) (see Figure 1)

PARAMETER tPLH tPHL FROM (INPUT) A thru H TO (OUTPUT) Y MIN = 25�C TYP MAX 54ACT11030 MIN 1.5 MAX 9.3 74ACT11030 MIN 1.5 MAX 8.5 8.7 UNIT ns

PARAMETER Cpd Power dissipation capacitance per gate TEST CONDITIONS = 50 pF, = 1 MHz TYP 41 UNIT pF


Features

Parameters

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Manufacturer information

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