|54ACTQ541 Quiet Series Octal Buffer/Line Driver with TRI-STATE Outputs
54ACTQ541 Quiet Series Octal Buffer/Line Driver with TRI-STATE � Outputs
The is an octal buffer and line driver with TRI-STATE outputs designed to be employed as a memory and address driver, clock driver, or bus-oriented transmitter/ receiver. The 'ACTQ541 is similar to the 'ACTQ244 while providing flow-through architecture (inputs on opposite sides from outputs). This pinout arrangement makes this device especially useful as an output port for microprocessors, allowing ease of layout and greater PC board density. The 'ACTQ541 utilizes NSC Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet SeriesTM features GTOTM output control and undershoot corrector in addition to a split ground bus for superior ACMOS performance.Features
n Non-inverting buffers n Guaranteed simultaneous switching noise level and dynamic threshold performance n Flow-through pinout for ease of PC board layout n Non-inverting TRI-STATETM outputs n TTL compatible inputs n CMOS power consumption n Output source/sink mA n Standard Microcircuit Drawing (SMD) 5962-9682901Description Output Enable Input (Active Low)
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance
GTOTM is a trademark of National Semiconductor Corporation. TRI-STATE is a registered trademark of National Semiconductor Corporation. FACTTM and FACT Quiet SeriesTM are trademarks of Fairchild Semiconductor Corporation.
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (VCC) DC Input Diode Current (IIK) VI = VCC 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = VCC 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up -0.5V to VCC -0.5V to VCC + 0.5VSource or Sink Current Junction Temperature (TJ) CDIP
Free Air Ambient Temperature Military Supply Voltage Military Minimum Input Edge Rate 'ACTQ Devices VIN from to 2.0V VCC to +5.5V (V/t) 125 mV/ns
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs.
Symbol Parameter VCC (V) VIH VIL VOH Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage to +125�C Guaranteed Limits (Note 3) VIN = VILor VIH 4.5 5.5 VOL Maximum Low Level Output Voltage (Note 3) VIN = VILor VIH 4.5 5.5 IIN IOZ ICCT IOLD IOHD ICC Maximum Input Leakage Current TRI-STATE Output Leakage Current, High or Low Maximum ICC/Input Minimum Dynamic Output Current (Note 4) Maximum Quiescent Supply Current mA �A VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND (Note �A mA IOL 24 mA IOL VI = VCC, GND VI = VCC 2.1V V IOH -24 mA IOH -24 mA IOUT �A V VOUT 0.1V or VCC - 0.1V VOUT 0.1V or VCC - 0.1V IOUT -50 �A Units Conditions
Symbol Parameter VCC (V) VOLP VOLV Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL
Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Max number of outputs defined as (n). Data inputs are to 3V. One output @ GND.
to +125�C VCC 50 pF Min tPLH tPHL tPZH tPZL tPHZ tPLZ Output Disable Time Propagation Delay Data to Outputs Output Enable Time Max ns Fig. Units No.
Symbol CIN COUT (Note 6) Parameter Input Capacitance Output Capacitance Max 12.0 15.0 Units pF Conditions = 25�C VCC = 0.0V VCC = 5.0VNote 6: COUT is measured at frequency = 1 MHz, per MIL-STD-883B, Method 3012.