Low power CMOS technology - Write current: 3 mA typical - Read current: 500 �A typical - Standby current: 500 nA typical x 8 bit organization 16 byte page Write cycle time: 5ms max. Self-timed ERASE and WRITE cycles Block write protection - Protect none, 1/2, or all of array Built-in write protection - Power on/off data protection circuitry - Write enable latch - Write protect pin Sequential read High reliability - Endurance: 10M cycles (guaranteed) - Data retention: > 200 years - ESD protection: V 8-pin PDIP, SOIC, and TSSOP packages Temperature ranges supported: - Commercial: (C) +70�C - Industrial: (I) +85�C - Automotive: (E) to +125�CEEPROM I/O Control Logic Memory Control Logic X Dec Page Latches Array
The Microchip Technology Inc. a 4K bit serial Electrically Erasable PROM. The memory is accessed via a simple Serial Peripheral Interface (SPI) compatible serial bus. The bus signals required are a clock input (SCK) plus separate data in (SI) and data out (SO) lines. Access to the device is controlled through a chip select (CS) input. Communication to the device can be paused via the hold pin (HOLD). While the device is paused, transitions on its inputs will be ignored, with the exception of chip select, allowing the host to service higher priority interrupts. Also, write operations to the device can be disabled via the write protect pin (WP).
*25xx040 is used in this document as a generic part number for the 25AA040/25LC040/25C040 devices. SPI is a trademark of Motorola.
Vcc...................................................................................7.0V All inputs and outputs w.r.t. Vss.................. to Vcc+1.0V Storage temperature....................................... to 150�C Ambient temperature under bias..................... to 125�C Soldering temperature of leads (10 seconds)............. +300�C ESD protection on all pins.................................................4kV
*Notice: Stresses above those listed under `Maximum ratings' may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an extended period of time may affect device reliability
Function Chip Select Input Serial Data Output Serial Data Input Serial Clock Input Write Protect Pin Ground Supply Voltage Hold Input
Commercial (C): TAMB to +70�C Industrial (I): TAMB to +85�C Automotive (E): TAMB to +125�C VCC to 5.5V VCC to 5.5V VCC 5.5V (25C040 only)All parameters apply over the specified operating ranges unless otherwise noted.
Parameter High level input voltage Low level input voltage Low level output voltage High level output voltage Input leakage current Output leakage current Internal Capacitance (all inputs and outputs)
Test Conditions VCC 2.7V (Note) VCC< 2.7V (Note) VCC 2.7V (Note) VCC < 2.7V (Note) IOL 2.1 mA IOL = 1.0 mA, VCC < 2.5V IOH CS = VCC, VIN = VSS TO VCC CS = VCC, VOUT = VSS TO VCC TAMB = 25�C, CLK = 1.0 MHz, VCC = 5.0V (Note) VCC 5.5V; FCLK=3.0 MHz; SO = Open VCC 2.5V; FCLK=2.0 MHz; SO = Open VCC= 5.5V VCC CS = Vcc = 5.5V, Inputs tied to VCC or VSS CS = Vcc = 2.5V, Inputs tied to VCC or VSSNote: This parameter is periodically sampled and not 100% tested.
Commercial (C): Industrial (I): Automotive (E): Symbol FCLK Tamb to +70�C Tamb to +85�C Tamb to +125�C Min 10M Max VCC to 5.5V VCC to 5.5V VCC 5.5V (25C040 only) Units MHz ns ms E/W Cycles (Note 2) VCC to 5.5V VCC to 4.5V VCC to 2.5V (Note 1) VCC to 5.5V (Note 1) VCC to 4.5V (Note 1) VCC to 2.5V (Note 1) VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V (Note 1) VCC to 4.5V (Note 1) VCC to 2.5V (Note 1) VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V VCC to 4.5V VCC to 2.5V (Note 1) (Note 1) VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V VCC to 4.5V VCC to 2.5V Test Conditions VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V VCC to 4.5V VCC to 2.5V VCC to 5.5V VCC to 4.5V VCC to 2.5V All parameters apply over the specified operating ranges unless otherwise noted. Parameter Clock FrequencyCLK Rise Time CLK Fall Time Clock High Time
Clock Delay Time Clock Enable Time Output Valid from Clock Low Output Hold Time Output Disable Time
Internal Write Cycle Time Endurance Note 1: 2:
This parameter is periodically sampled and not 100% tested. This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific application, please consult the Total Endurance Model which can be obtained on Microchip's BBS or website.