54ABT541J-QML Datasheet

Octal Buffer/line Driver With Tri-state Outputs


Features, Applications
54ABT541 Octal Buffer/Line Driver with TRI-STATE Outputs
54ABT541 Octal Buffer/Line Driver with TRI-STATE � Outputs

The is an octal buffer and line driver with TRI-STATE outputs designed to be employed as a memory and address driver, clock driver, or bus-oriented transmitter/ receiver. The 'ABT541 is similar to the 'ABT244 with broadside pinout. n Guaranteed latchup protection n High impedance glitch free bus loading during entire power up and power down cycle n Nondestructive hot insertion capability n Flow-through pinout for ease of PC board layout n Disable time less than enable time to avoid bus contention n Standard Microcircuit Drawing (SMD) 5962-9471801

n Non-inverting buffers n Output sink capability of 48 mA, source capability 24 mA

Military 54ABT541W-QML 54ABT541E-QML Package Number E20A 20-Lead Ceramic Dual-In-Line 20-Lead Cerpack 20-Lead Ceramic Leadless Chip Carrier, Type C Pin Names I0�I7 O0�O7 Inputs Outputs Description Output Enable Input (Active Low) Package Description

H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance
TRI-STATE is a registered trademark of National Semiconductor Corporation.

Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias Ceramic VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Any Output in the Disabled or Power-Off State in the HIGH State Current Applied to Output +5.0 mA

in LOW State (Max) DC Latchup Source Current Over Voltage Latchup (I/O)

Free Air Ambient Temperature Military Supply Voltage Military Minimum Input Edge Rate Data Input Enable Input to +5.5V (V/t) 50 mV/ns 20 mV/ns

Symbol VIH VIL VCD VOH VOL IIH IBVI IIL VID IOZH IOZL IOS ICEX IZZ ICCH ICCL ICCZ ICCT Parameter Min Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Input LOW Current Input Leakage Test Output Leakage Current Output Leakage Current Output Short-Circuit Current Output High Leakage Current Bus Drainage Test Power Supply Current Power Supply Current Power Supply Current Additional ICC/Input Outputs Enabled Outputs TRI-STATE Outputs TRI-STATE ICCD Dynamic ICC (Note 4) No Load mA �A mA/ MHz Max - 5.5V Max 0.0 Max �A Max VIN = 0.5V (Note 4) VIN = 0.0V IID 1.9 �A All Other Pins Grounded VOUT = 2.7V; OEn = 2.0V VOUT = 0.5V; OEn = 2.0V VOUT = 0.0V VOUT = VCC VOUT = 5.5V; All Others GND All Outputs HIGH All Outputs LOW OEn = VCC; All Others at VCC or Ground VI = VCC - 2.1V Enable Input VI = VCC - 2.1V Data Input VI = VCC - 2.1V; All Others at VCC or Ground Outputs Open, OEn = GND, One Bit Toggling (Note 3), 50% Duty Cycle

Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz. Note 4: Guaranteed, but not tested.

Symbol VOLP VOLV Parameter Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Min Max 1.0 -1.45 Units V VCC 5.0 Conditions = 50 pF, = 25�C (Note = 25�C (Note 5)

Note 5: Max number of outputs defined as (n). - 1 data inputs are driven to 3V. One output at LOW. Guaranteed, but not tested.

to +125�C VCC 50 pF Min tPLH tPHL tPZH tPZL tPHZ tPLZ Output Disable Time Propagation Delay Data to Outputs Output Enable Time Max ns

Symbol CIN COUT (Note 6) Parameter Input Capacitance Output Capacitance Typ 5.0 9.0 Units pF Conditions = 25�C VCC = 0.0V VCC = 5.0V

Note 6: COUT is measured at frequency = 1 MHz, per MIL-STD-883B, Method 3012.



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