The 'ACTQ16245 contains sixteen non-inverting bidirectional buffers with TRI-STATE outputs and is intended for bus oriented applications. The device is byte controlled. Each has separate control inputs which can be shorted together for full 16-bit operation. The T/R inputs determine the direction of data flow through the device. The OE inputs disable both the A and B ports by placing them in a high impedance state. The 'ACTQ16245 utilizes NSC Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series � features GTO � output control for superior performance.Features
n Utilizes NSC FACT Quiet Series technology n Guaranteed simultaneous switching noise level and dynamic threshold performance n Bidirectional non-inverting buffers n Separate control logic for each byte n 16-bit version of the 'ACTQ245 n Outputs source/sink mA n Standard Microcircuit Drawing (SMD) 5962-9562001
Pin Names OEn T/R A0�A15 B0�B15 Description Output Enable Input (Active Low) Transmit/Receive Input Side A Inputs/Outputs Side B Outputs/Inputs
GTOTM is a trademark of National Semiconductor Corporation. TRI-STATE is a registered trademark of National Semiconductor Corporation. FACTTM and FACT Quiet SeriesTM are trademarks of Fairchild Semiconductor Corporation.
The 'ACTQ16245 contains sixteen non-inverting bidirectional buffers with TRI-STATE outputs. The device is byte controlled with each byte functioning identically, but independent of the other. The control pins can be shorted together to obtain full 16-bit operation. The following description applies to each byte. When the T/R input is HIGH, then Bus A data
is transmitted to Bus B. When the T/R input is LOW, Bus B data is transmitted to Bus A. The TRI-STATE outputs are controlled by an Output Enable (OEn) input for each byte. When OEn is LOW, the outputs are in 2-state mode. When OEn is HIGH, the outputs are in the high impedance mode, but this does not interfere with entering new data into the inputs.
Inputs L H Inputs H X Bus B8�B15 Data to Bus A8�A15 Bus A8�A15 Data to Bus B8�B15 HIGH-Z State H X Bus B0�B7 Data to Bus A0�A7 Bus A0�A7 Data to Bus B0�B7 HIGH-Z State A0�A7, B0�B7 OutputsH = High Voltage Level L = Low Voltage Level X = Immaterial Z = High Impedance
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (VCC) DC Input Diode Current (IIK) VI = VCC 0.5V DC Output Diode Current (IOK) VO = VCC +0.5V DC Output Voltage (VO) DC Output Source/Sink Current (IO) DC VCC or Ground Current per Output Pin Junction Temperature C-DIP Storage Temperature -0.5V to VCC 50 mA
Supply Voltage (VCC) 'ACTQ Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) 54ACTQ Minimum Input Edge Rate (dV/dt) 'ACTQ Devices VIN from to 2.0V VCC 0V to VCC 0V to VCC +125�C 125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception to ensure that the system design is reliable over its power supply, temperature, and output/input loading varaibles. National does not recommend operation of FACTTM circuits outside databook specifications.
Symbol Parameter VCC (V) to +125�C Guaranteed Limits VIH VIL VOH Minimum High Input Voltage Maximum Low Input Voltage Minimum High Output Voltage (Note 2) VIN = VIL or VIH 4.5 5.5 VOL Maximum Low Output Voltage (Note 2) VIN = VIL or VIH 4.5 5.5 IOZT IIN ICCT ICC IOLD IOHD VOLP VOLV Maximum I/O Leakage Current Maximum Input Leakage Current Maximum ICC/Input Max Quiescent Supply Current Minimum Dynamic Output Current (Note 3) Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL
Note 2: All outputs loaded; thresholds associated with output under test. Note 3: Maximum test duration 2.0 ms; one output loaded at a time.
IOL 24 mA IOL VI = VIL, VIH VO = VCC, GND VI = VCC, GND VI = VCC -2.1V VIN = VCC or GND (Note 6) VOLD = 1.65V Max VOHD = 3.85V Min (Notes 4, 5)