HomedatasheetCAT93C4612PI-45TE13

CAT93C4612PI-45TE13 Datasheet

4-Kb Microwire Serial CMOS Eeprom
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Description

Features, Applications

FEATURES

High speed operation: to 5.5V supply voltage range Selectable or x16 memory organization Sequential read Software write protection Power-up inadvertant write protection Low power CMOS technology 1,000,000 Program/erase cycles 100 year data retention Industrial temperature ranges RoHS-compliant 8-pin PDIP, SOIC, TSSOP and 8-pad TDFN packages For Ordering Information details, see page 15.

DESCRIPTION

The a 4-Kb CMOS Serial EEPROM device which is organized as either 256 registers of 16 bits (ORG pin at VCC) or 512 registers of 8 bits (ORG pin at GND). Each register can be written (or read) serially by using the DI (or DO) pin. The CAT93C66 features sequential read and self-timed internal write with auto-clear. On-chip Power-On Reset circuitry protects the internal logic against powering up in the wrong state.

* TDFN 3x3mm (ZD4) package is available only for Die Rev E (not recommended for new designs)

Pin Name DI DO VCC GND ORG NC Function Chip Select Clock Input Serial Data Input Serial Data Output Power Supply Ground Memory Organization No Connection

Note: When the ORG pin is connected to VCC, the x16 organization is selected. When it is connected to ground, the x8 organization is selected. If the ORG pin is left unconnected, then an internal pullup device will select the x16 organization

� 2007 Catalyst Semiconductor, Inc. Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS(1) Parameters Storage Temperature Voltage on Any Pin with Respect to Ground RELIABILITY CHARACTERISTICS(3) Symbol NEND

D.C. OPERATING CHARACTERISTICS (NEW PRODUCT, DIE REV. G) VCC to +85�C unless otherwise specified. Symbol ISB1 ISB2 ILI ILO VOL2 VOH2

Notes: (1) Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. (2) The DC input voltage on any pin should not be lower than -0.5V or higher than VCC + 0.5V. During transitions, the voltage on any pin may undershoot to no less than -1.5V or overshoot to no more than VCC + 1.5V, for periods of less than 20 ns. (3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and JEDEC test methods. (4) Block Mode, VCC 5V, 25�C

Parameter Power Supply Current (Write) Power Supply Current (Read) Power Supply Current (Standby) (x8 Mode) Power Supply Current (Standby) (x16 Mode) Input Leakage Current Output Leakage Current Input Low Voltage Input High Voltage Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage Output Low Voltage Output High Voltage

Test Conditions fSK = 1MHz, VCC = 5.0V fSK = 1MHz, VCC = 5.0V VIN = GND or VCC, CS = GND ORG = GND VIN = GND or VCC, CS = GND ORG = Float or VCC VIN = GND to VCC VOUT = GND to VCC, CS = GND 4.5V VCC 5.5V 4.5V VCC 5.5V 1.8V VCC 4.5V 1.8V VCC < 4.5V VCC < 5.5V, IOL 2.1mA 4.5V VCC < 5.5V, IOH -400�A 1.8V VCC < 4.5V, IOL 1mA 1.8V VCC < 4.5V, IOH = -100�A

D.C. OPERATING CHARACTERISTICS (MATURE PRODUCT, DIE REV. E � Not Recommended for New Designs) VCC to +5.5V, unless otherwise specified. Symbol ISB1 ISB2 ILI ILO VOL2 VOH2 Parameter Power Supply Current (Write) Power Supply Current (Read) Power Supply Current (Standby) (x8 Mode) Power Supply Current (Standby) (x16 Mode) Input Leakage Current Output Leakage Current Input Low Voltage Input High Voltage Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage Output Low Voltage Output High Voltage Test Conditions fSK = 1MHz, VCC = 5.0V fSK = 1MHz, VCC = 5.0V VIN = GND or VCC, CS = GND ORG = GND VIN = GND or VCC, CS = GND ORG = Float or VCC VIN = GND to VCC VOUT = GND to VCC, CS = GND 4.5V VCC 5.5V 4.5V VCC 5.5V 1.8V VCC 4.5V 1.8V VCC < 4.5V VCC < 5.5V, IOL 2.1mA 4.5V VCC < 5.5V, IOH -400�A 1.8V VCC < 4.5V, IOL 1mA 1.8V VCC < 4.5V, IOH = -100�A VCC x 0.7 Min Max VCC + 1 VCC x 0.2 VCC 1 0.4 Units mA �A

Notes: (1) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and JEDEC test methods.

Test Output Capacitance (DO) Input Capacitance (CS, SK, DI, ORG)

Features

Parameters

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