HomedatasheetIS41LV16100B-50TLI-TR

IS41LV16100B-50TLI-TR Datasheet

DRAM
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Description

The ISSI IS41LV16100B-50TLI-TR/ IS41LV16100 is 1,048,576 x 16-bit high-performance CMOS Dynamic Random Access Memories. These devices offer an accelerated cycle access called EDO Page Mode. EDO Page Mode allows 1,024 random accesses within a single row with access cycle time as short as 20 ns per 16-bit word. These features make the IS41LV16100B ideally suited for high-bandwidth graphics, digital signal processing, highperformance computing systems, and peripheral applications. The IS41LV16100B-50TLI-TR/IS41LV16100 is packaged in a 42-pin 400-mil SOJ and 400-mil 50- (44-) pin TSOP (Type II). IS41LV16100B-50TLI-TR Features • TTL compatible inputs and outputs; tristate I/O• Refresh Interval:-Auto refresh Mode: 1,024 cycles /16 ms-RAS-Only, CAS-before-RAS (CBR), and Hidden-Self refresh Mode: 1,024 cycles /128 ms• JEDEC standard pinout• Single power supply: 3.3V ± 10%• Byte Write and Byte Read operation via two CAS• Industrial Temperature Range: -40oC to +85oC• Lead-free available
Features

Parameters

[{"Name":" Minimum Operating Temperature:","Value":"- 40 C"},{"Name":" Maximum Operating Temperature:","Value":"+ 85 C"},{"Name":"Maximum Operating Current:","Value":"180 mA"},{"Name":" Supply Voltage - Min:","Value":"3 V"},{"Name":"Supply Voltage - Max:","Value":"3.6 V"},{"Name":" Access Time:","Value":"50 ns"},{"Name":"Memory Size:","Value":"16 MB"},{"Name":" Organization:","Value":"1 Mbit x 16"},{"Name":"","Value":""},{"Name":"","Value":""}]

Manufacturer information

SEIKO INSTRUMENTS

Seiko Instruments Inc. Is a Japanese company which head office is located in 8, Nakase 1-chome, Mihama-ku, Chiba-shi, Chiba 261-8507, Japan . It’s business lines are: Watches Business Watches, Watch Movements Electronic Components Business Quartz crystals, Micro batteries, etc. Precision Mechatronics Business Inkjet printer heads, Hard disk components, Thermal printers, Compact precision components, Machine tools, FA, Musical instrument accessories, Radiation detection and measurement systems, etc.


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