FEATURES Space Saving SO-8 or Mini-DIP Packages Complete, Voltage Output with Internal Reference 1 mV/Bit with 4.095 V Full Scale Single +5 Volt Operation No External Components 3-Wire Serial Data Interface, 20 MHz Data Loading Rate Low Power: 2.5 mW APPLICATIONS Portable Instrumentation Digitally Controlled Calibration Servo Controls Process Control Equipment PC Peripherals
The is a complete serial input, 12-bit, voltage output digital-to-analog converter designed to operate from a single +5 V supply. It contains the DAC, input shift register and latches, reference and a rail-to-rail output amplifier. Built using a CBCMOS process, these monolithic DACs offer the user low cost, and ease of use +5 V only systems. Coding for the DAC8512 is natural binary with the MSB loaded first. The output op amp can swing to either rail and is set to a range to +4.095 V--for a one-millivolt-per-bit resolution. It is capable of sinking and sourcing 5 mA. An on-chip reference is laser trimmed to provide an accurate full-scale output voltage 4.095 V.
Serial interface is high speed, three-wire, DSP compatible with data in (SDI), clock (CLK) and load strobe (LD). There is also a chip-select pin for connecting multiple DACs. A CLR input sets the output to zero scale at power on or upon user demand. The DAC8512 is specified over the extended industrial to +85�C) temperature range. DAC8512s are available in plastic DIPs and SO-8 surface mount packages.
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 World Wide Web Site: http://www.analog.com Fax: 617/326-8703 � Analog Devices, Inc., 1996
Parameter STATIC PERFORMANCE Resolution Relative Accuracy Differential Nonlinearity Zero-Scale Error Full-Scale Voltage Full-Scale Tempco ANALOG OUTPUT Output Current Load Regulation at Full Scale Capacitive Load LOGIC INPUTS Logic Input Low Voltage Logic Input High Voltage Input Leakage Current Input Capacitance Symbol N INL DNL VZSE VFS TCVFS IOUT LREG CL VIL VIH IIL CIL
Condition Note 2 E Grade F Grade No Missing Codes Data = 000H Data = FFFH3 Notes 3, 4 Data to , Data No Oscillation4
INTERFACE TIMING SPECIFICATIONS1, 4 Clock Width High tCH Clock Width Low tCL Load Pulse Width tLDW Data Setup tDS Data Hold tDH Clear Pulse Width tCLRW Load Setup tLD1 Load Hold tLD2 Select tCSS Deselect tCSH AC CHARACTERISTICS4 Voltage Output Settling Time DAC Glitch Digital Feedthrough SUPPLY CHARACTERISTICS Positive Supply Current Power Dissipation Power Supply Sensitivity tS
NOTES 1 All input control signals are specified with +5 V) and timed from a voltage level 2 1 LSB 1 mV for +4.095 V output range. 3 Includes internal voltage reference error. 4 These parameters are guaranteed by design and not subject to production testing. 5 The settling time specification does not apply for negative going transitions within the last 6 LSBs of ground. Some devices exhibit double the typical settling time in this 6 LSB region. Specifications subject to change without notice.
Parameter STATIC PERFORMANCE Relative Accuracy Differential Nonlinearity Zero-Scale Error Full-Scale Voltage LOGIC INPUTS Logic Input Low Voltage Logic Input High Voltage Input Leakage Current SUPPLY CHARACTERISTICS Positive Supply Current Power Dissipation Power Supply Sensitivity= +25C, applies to part number DAC8512GBC only, unless otherwise noted)
Symbol INL DNL VZSE VFS VIL VIH IIL IDD PDISS PSS VIH 2.4 V, VIL= V, No Load VDD 5 V, VIL V, No Load VIH 2.4 V, VIL V, No Load VDD 5 V, VIL V, No Load VDD � 5% Condition Min �2 �1 Typ Max Units LSB mA mW
NOTE Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
VDD to GND. +10 V Logic Inputs to GND. �0.3 V, VDD 0.3 V VOUT to GND. �0.3 V, VDD 0.3 V IOUT Short Circuit to GND. 50 mA Package Power Dissipation. (TJ max � TA)/JA Thermal Resistance JA 8-Pin Plastic DIP Package (P). 103�C/W 8-Lead SOIC Package (S). 158�C/W Maximum Junction Temperature (TJ max). +150�C
Operating Temperature Range. to +85�C Storage Temperature Range. to +150�C Lead Temperature (Soldering, 10 secs). +300�C
*Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the DAC8512 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ORDERING GUIDE INL Temperature (LSB) Range +85�C +25�C Package Description Option 8-Pin P-DIP N-8 8-Pin P-DIP N-8 8-Lead SOIC SO-8 Dice
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