HomedatasheetSN74LVC1G04YZVR

SN74LVC1G04YZVR Datasheet

Inverters
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Description

SN74LVC1G04YZVR This single inverter gate is designed for 1.65-V to 5.5-V VCC operation.The SN74LVC1G04 performs the Boolean function Y = A.NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,preventing damaging current backflow through the device when it is powered down. SN74LVC1G04YZVR Features • Supports 5-V Vcc Operation• Inputs Accept Voltages to 5.5 V• Maxt,,of3.3nsat3.3V• Low Power Consumption, 10-pA Max Icc• 24-mA Output Drive at 3.3 V• Supports Partial-Power-Down Mode Operation• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II• ESD Protection Exceeds JESD 22 SN74LVC1G04YZVR Applications • Controlled Baseline• One Assembly/Test Site• One Fabrication Site• Available in Military (-550C/1250C)Temperature Range(1)• Extended Product Life Cycle• Extended Product-Change Notification• Product Traceability
Features

Parameters

[{"Name":"High Level Output Current","Value":"- 32 mA"},{"Name":"Low Level Output Current","Value":"32 mA"},{"Name":"Supply Voltage - Max","Value":"5.5 V"},{"Name":"Supply Voltage - Min","Value":"1.65 V"},{"Name":"Maximum Operating Temperature","Value":"+ 85 C"},{"Name":"Operating Supply Voltage","Value":"1.65 V to 5.5 V"},{"Name":"","Value":""},{"Name":"","Value":""},{"Name":"","Value":""},{"Name":"","Value":""}]

Manufacturer information

SEIKO INSTRUMENTS

Seiko Instruments Inc. Is a Japanese company which head office is located in 8, Nakase 1-chome, Mihama-ku, Chiba-shi, Chiba 261-8507, Japan . It’s business lines are: Watches Business Watches, Watch Movements Electronic Components Business Quartz crystals, Micro batteries, etc. Precision Mechatronics Business Inkjet printer heads, Hard disk components, Thermal printers, Compact precision components, Machine tools, FA, Musical instrument accessories, Radiation detection and measurement systems, etc.


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